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Atomic resolution microscopy of surfaces and interfaces symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.

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Published by Materials Research Society in Pittsburgh, Pa .
Written in English

Subjects:

  • Materials -- Microscopy -- Congresses.,
  • Atom-probe field ion microscopy -- Congresses.

Book details:

Edition Notes

Includes bibliographical references and indexes.

Statementeditor, David J. Smith.
SeriesMaterials Research Society symposium proceedings,, v. 466, Materials Research Society symposia proceedings ;, v. 466.
ContributionsSmith, David J., 1948-
Classifications
LC ClassificationsTA417.23 .A86 1997
The Physical Object
Paginationix, 282 p. :
Number of Pages282
ID Numbers
Open LibraryOL682964M
ISBN 101558993703
LC Control Number97029693

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: Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution () by Tsong, Tien T. and a great selection of similar New, Used and Collectible Books available now at great Range: $ - $ Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic. Tracing recent advances in the imaging of electrified surfaces, this volume describes cutting-edge techniques that allow us to record real-time and real-space images with atomic resolution, observe structures of surfaces and interfaces directly on a display, study the distribution of atoms and molecules during a surface reaction, and much more. Atomic force Microscopy of Biomaterials Surfaces and Interfaces Article in Surface Science (3) October with Reads How we measure 'reads'.

Find many great new & used options and get the best deals for Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution by Tien T. Tsong (, Paperback) at the best online prices at eBay! Free shipping for many products! The best-known atomic-resolution surface microscopy is scanning tunneling microscopy (see Scanning Tunneling Microscopy). Developed in the early s, the scanning tunneling has become commonplace in most research institutes. Large strides were made during the last decade in applying the STM to the study of single atom movements on surfaces. Atomic Force Microscopy. The atomic force microscope is a type of scanning probe microscope. Atomic force microscopy (AFM) allows for three-dimensional characterization with a subnanometer resolution [31]. This technique can characterize NPs as small as nm, which makes it advantageous over other traditional techniques like DLS microscopy. Atomic Force Microscopy for Surface Imaging and Characterization of Supported Nanostructures Chapter January with Reads How we measure 'reads'.

@article{osti_, title = {Atomic resolution with the atomic force microscope on conductors and nonconductors}, author = {Albrecht, T R and Quate, C F}, abstractNote = {The atomic force microscope (AFM) has achieved atomic resolution on nonconducting as well as electrically conducting surfaces, opening a new class of materials to atomically resolved surface imaging. Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and . Hydration layers are ubiquitous in life and technology. Hence, interfacial aqueous layers have a central role in a wide range of phenomena from materials science to molecular and cell biology. A complete understanding of those processes requires, among other things, the development of very-sensitive and high-resolution instruments. Three-dimensional atomic force microscopy Cited by: 7. A combined scanning electrochemical microscope (SECM)−atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM−AFM, have been fabricated by coating flattened and etched Pt microwires with Cited by: